XP33ROD - Rozpoznávání pro doktorandy (Pattern Recognition)

The subject introduces pattern recognition (called also machine learning). The subject is intended for doctoral students. I can take master students after an initial interview about student's motivation as well. The lectures are open to bachelor students but no credit for the subject will be awarded.

It is expected that student did not study this subject before, e.g. in the bachelor subject Rozpoznávání a strojové učení, B4M33RPZ, B4M33RPZ lectured by Prof. Jiří Matas. The lecturer will ask the student if she/he did not pass a similar subject to avoid getting credits easily.

The subject comprises of lectures and consultations with the lecturer (if the student asks for it).

It is required that the student passed an introductory course of the probability theory and statistics or studied this area individually.

• The lectures are scheduled regularly for Wednesdays from 9:15 to 10:45. We will discuss the date/time of the lecture with the students at the first lecture. We might find a better date/time that suits the majority of students and the lecturer.
• The lectures take place at a regular time distantly using the Microsoft Teams tool (channel) until further notice. The reason is the COVID-19 crisis. After COVID constraints are over, we will lecture in the room JP:B-633, building B, Praha 6, Jugoslávských partyzánů 1580/3.
• 2 x 45 minutes of lecture a week, i.e. 90 minutes in one single lecture.
• If there is one non-Czech-speaking student in the audience then the lecture will be given in English. The lecture presentation will be in English typically even if the lecture is given in Czech.
• Irregularities in the lecture schedule might be needed due to the lecturers' business trips. The replacement date will be discussed with the students in advance.
• Presentations to be given/given at the lecture are available either in English or in Czech or in both languages. The presentation will be typically improved before the lecture.
• Lecturer's abbreviation VH - Václav Hlaváč, RŠ - Radoslav Škoviera

• The exam has two parts, a written test, and an oral part. The written test checks the students' overview of the subject. In a written part, the student answers typically five questions. The written test counts for 50 points maximally.
• In the oral part of the exam following the written part, the teacher finds a topic related to the subject from the students' paper. The aim of the oral exam is to check if the student knows some part of the subject topic in more detail. The oral part counts for 50 points maximally.
• The oral part of the exam follows the written part after the written part is corrected by the teacher. The oral part is a discussion of a student and the teacher about a scientific paper of the student's choice. The paper has to be from a respected scientific journal, which cannot be older than five years. The paper has to have a relation to the subject and be written in English. The privilege to choose the paper gives the student the opportunity to bring the discussion to the area he has a deeper knowledge. Students come to the exam with a printed version of the paper with her/his handwritten notes made while reading the paper.
• The list of journals from which the paper can be selected: IEEE Transactions on Pattern Analysis and Machine Intelligence, Pattern Recognition (Elsevier), Machine Learning (Springer). The Czech Government pays its universities electronic access to papers. Use https://dialog.cvut.cz/
• The resulting mark follows from the sum of points. The maximum number of points is 100. The evaluation Excellent is for 80 points and more. The evaluation Passed is for 51 points and more. Otherwise, the student failed the exam.

• Schlesinger M.I., Hlaváč V.: Ten lectures on statistical and structural pattern recognition, Kluwer Academic Publishers, Dordrecht, The Netherlands, 2002. Edition in Czech Vydavatelství ČVUT Praha, 1999.
• Duda R.O., Hart, P.E., Stork, D.G.: Pattern Classification, John Willey and sons, 2nd edition, New York, 2001.
• Bishop, C.M: Pattern Recognition and Machine Learning, Springer, New York, 2006.